Brian Collins

Brian joined American Glass Research in 1986. His principle areas of expertise include stone analysis, inside surface topography for Pharmaceuticals and contaminant analysis. He is also a specialist for the Scanning Electron Microscope (SEM/EDX). Brian developed and is the primary instructor for our Analysis of Stones seminar. Brian holds an AAS degree in Metrology from Butler Community College. Previously Brian spent seven years with Zedmark Inc.